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Metrology

Metrology

ICis Microscope

ICis is a modular microscope offering up to 3 standard modes, often required by professionals in the electronics and related industries. The system is designed to be a primary tool for the engineer or technician working at a nearby polishing station. ICis allows for fast substrate thickness...

ULTRACOLLIMATOR

ULTRACOLLIMATOR modules allow the user to produce the finest results of sample parallelism with both flat lapping and selected area preparation machines. The units produce a ‘single box’ solution, incorporating an lcd screen and all the controls required to align the sample. The...

ULTRASPEC-III

Our patented ULTRASPEC-III coherent laser illumination source is designed to meet the needs of today’s photoemission microscopes as well as backside imaging stations. In standard configuration with laser wavelengths at 660nm, 1064nm and 1300nm, you have the immediate flexibility to illuminate...

Height Indicators

  ULTRA TEC's  height indicators allow for a no-nonsense method of accurately measuring material removed by surface preparation processes. They provide an 'insurance policy' reference point, in case machine settings are forgotten or as a second opinion.  A choice of...
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Featured Product

Using the correct illuminator makes all the difference

You wouldn’t limit your microscope with improper optics, so why limit it with improper illumination? ULTRASPEC-III offers laser wavelengths at 660nm, 1064nm and 1300nm. This...

TEC Tip

ICis Microscope offers 3 Advanced Imaging Modes for the IC Product Engineer

ICis is an advanced modular microscope offering up to 3 standard imaging modes -- NIR for Backside Imaging, UV for highest resolution, and Megapixel Color Imaging for topside parallel polishing. The...