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Introducing 'In-Situ' RST Measurement & Ultra-High Definition Targeting for Micro-electronic Sample Prep

November 28, 2017

Shown for the first time at ISTFA 2017 -- ULTRA TEC is pleased to introduce a major...

enabling FAILURE ANALYSIS Newsletter

November 2015 -- Read the latest copy of our Surface & Sample Prep Products Newsletter for the microelectronics and related market sectors.

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50th Anniversary Ad for Technical Journals

October 1, 2015 (Santa Ana, CA) -- This year ULTRA TEC Manufacturing, Inc. celebrates 50 years of business. Over this time we've seen the birth and growth of a...

New ULTRASLICE Precision Saw Brochure Available

March 2015 --  A new ULTRASLICE Brochure is Available. Contact us to request a hard copy -- or download here.

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EDFA Guest Editorial Provides Talking Points for New Generations of Sample Preparation Tools

December 2014 - Packages Have Become the New IC's -- EDFA Magazine Guest Editorial by Jim Colvin

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enabling FAILURE ANALYSIS Newsletter -- New Edition Published

October 28, 2014 -  ULTRA TEC MFg., Inc. has published its latest semiconductor FA-related newsletter. The latest edition features news and video segments related the improved ...

50 Year Anniversary Badge announced

Santa Ana, California, July 25, 2014 -- ULTRA TEC Manufacturing, Inc. announces a new company emblem in preparation for our upcoming 50th Anniversary. '50 Years of ULTRA TEC' branding will be featured on...

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Featured Product

ULTRAPOL FIBERLAB Module System

ULTRAPOL FIBERLAB Module System is a new product in ULTRA TEC’s Fiber Optic Polishing Product Line.  The main...

Company News

Introducing 'In-Situ' RST Measurement & Ultra-High Definition Targeting for Micro-electronic Sample Prep

November 28, 2017

Shown for the first time at ISTFA 2017 -- ULTRA TEC is pleased to introduce a major...

TEC Tip

ICis Microscope offers 3 Advanced Imaging Modes for the IC Product Engineer

ICis is an advanced modular microscope offering up to 3 standard imaging modes -- NIR for Backside Imaging, UV for highest resolution, and Megapixel Color Imaging for topside parallel polishing. The...