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enabling FAILURE ANALYSIS Newsletter

November 2015 -- Read the latest copy of our Surface & Sample Prep Products Newsletter for the microelectronics and related market sectors.

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50th Anniversary Ad for Technical Journals

October 1, 2015 (Santa Ana, CA) -- This year ULTRA TEC Manufacturing, Inc. celebrates 50 years of business. Over this time we've seen the birth and growth of a...

New ULTRASLICE Precision Saw Brochure Available

March 2015 --  A new ULTRASLICE Brochure is Available. Contact us to request a hard copy -- or download here.

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EDFA Guest Editorial Provides Talking Points for New Generations of Sample Preparation Tools

December 2014 - Packages Have Become the New IC's -- EDFA Magazine Guest Editorial by Jim Colvin

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enabling FAILURE ANALYSIS Newsletter -- New Edition Published

October 28, 2014 -  ULTRA TEC MFg., Inc. has published its latest semiconductor FA-related newsletter. The latest edition features news and video segments related the improved ...

50 Year Anniversary Badge announced

Santa Ana, California, July 25, 2014 -- ULTRA TEC Manufacturing, Inc. announces a new company emblem in preparation for our upcoming 50th Anniversary. '50 Years of ULTRA TEC' branding will be featured on...

PEEC Endpoint Characterization Introduced @ ISTFA 2013

November 5, 2013 -- San Jose, CA -- ULTRA TEC Manufacturing, Inc. (Santa Ana, CA) announces the availability of a new technology, PEEC, for use with its popular ASAP-1 IPS Digital Preparation System...

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Featured Product

ULTRAPOL FIBERLAB Module System

ULTRAPOL FIBERLAB Module System is a new product in ULTRA TEC’s Fiber Optic Polishing Product Line.  The main...

TEC Tip

Antireflective coating offers optimized backside imaging

ARC-lite provides a rapid, easy-to-apply and effective coating for improving backside imaging on thinned and polished semiconductor substrates. By applying a few drops of ARC-lite Imaging fluid and a short 45 second...