INFRATEC-1 allows for fast, convenient backside imaging in the sample preparation laboratory. Validation of sample preparation and remaining silicon thickness can be obtained without moving the sample to an emission or other backside microscope.

INFRATEC-1 reaches maximum functionality when used with ULTRA TEC's  ASAP-1 Selected Area Preparation System -- The sample mounting plate (pictured below) can be conveniently transferred between INFRATEC-1, ARC-lite and ASAP-1

Imaged part under 20x objective, processed by ASAP-1 and ARC-lite

Picture shows INFRATEC's advanced X-Y table that accepts sample mounting plates directly from ASAP-1 and ARC-lite selected area preparation machines.

Order Codes

>> Download the INFRATEC-1 Datasheet

>> Find out more about ARC-lite

>> Find out more about ASAP-1

>> Other SAP Resources

Product Highlights

   Imaging integration from 0.1 to 15 seconds – ensures imaging effectiveness

  Uses standard mounting plates from SAP products for ease of transfer between equipment

  Small footprint – can be positioned in sample prep lab for convenience

  Inexpensive -- affordable for every lab

Focal Depth Measurement - accurate focus block allows for easy determination of remaining silicon thickness.