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Introducing 'In-Situ' RST Measurement & Ultra-High Definition Targeting for Micro-electronic Sample Prep

November 28, 2017

Shown for the first time at ISTFA 2017 -- ULTRA TEC is pleased to introduce a major new 'in situ' metrology module for ASAP-1 IPS. Click on the newsletter below tofind out more about 'situ' RST measurement and ultra-hd targeting.

 

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More Images from ISTFA 2017 - Pasadena, CA

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Featured Product

ULTRAPOL FIBERLAB Module System

ULTRAPOL FIBERLAB Module System is a new product in ULTRA TEC’s Fiber Optic Polishing Product Line.  The main...

Company News

Introducing 'In-Situ' RST Measurement & Ultra-High Definition Targeting for Micro-electronic Sample Prep

November 28, 2017

Shown for the first time at ISTFA 2017 -- ULTRA TEC is pleased to introduce a major...

TEC Tip

Taking sample alignment to the next level, brings better polishing results

ULTRACOLLIMATOR allows for unequalled precision in sample parallelism alignment. This advanced LASER optical module is available for all of ULTRA TEC's key flat and slected area polishing products....