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SEM Stub Holders

for ULTRAPOL Advance & MULTIPOL (with QR Interface)

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Product Highlights

  • Wide range of holders suit most SEM's, FIB's
  • Reduces re-mounting times -- better throughput
  • QR allows for fast microscope transfer
ORDER CODE DESCRIPTION
6172.H Sample holder for Hitachi SEM stubs - QR - optical - includes 1 stub
6175.H PLANAR - Delayering Hitachi SEM stub - optical
6172.P Sample holder for Philips SEM stubs - QR - optical - includes 1 stub
6175.P PLANAR - Delayering Philips SEM stub - optical
6172.H48 Sample holder for Hitachi 4800 SEM stubs - QR - optical - includes 1 stub
6175.H48 PLANAR - Delayering Hitachi 4800 SEM stub - optical
6172.J Sample holder for JEOL SEM stubs - QR - optical - includes 1 stub
6175.J PLANAR - Delayering JEOL SEM stub - optical
6172.F Sample holder for FEI SEM stubs - QR - optical - includes 1 stub
6175.F PLANAR - Delayering FEI SEM stub - optical
6172.Z Sample holder for Zeiss (Ultra 55) SEM stubs - QR - optical - includes 1 stub -- also fitsLEO
6175.Z PLANAR - Delayering Zeiss (Ultra 55)SEM stub - optical -- also fitsLEO

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