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SEM Stub Holders
for ULTRAPOL Advance & MULTIPOL (with QR Interface)
Click Additional Images to Enlarge
Product Highlights
- Wide range of holders suit most SEM's, FIB's
- Reduces re-mounting times -- better throughput
- QR allows for fast microscope transfer
| ORDER CODE | DESCRIPTION |
|---|---|
| 6172.H | Sample holder for Hitachi SEM stubs - QR - optical - includes 1 stub |
| 6175.H | PLANAR - Delayering Hitachi SEM stub - optical |
| 6172.P | Sample holder for Philips SEM stubs - QR - optical - includes 1 stub |
| 6175.P | PLANAR - Delayering Philips SEM stub - optical |
| 6172.H48 | Sample holder for Hitachi 4800 SEM stubs - QR - optical - includes 1 stub |
| 6175.H48 | PLANAR - Delayering Hitachi 4800 SEM stub - optical |
| 6172.J | Sample holder for JEOL SEM stubs - QR - optical - includes 1 stub |
| 6175.J | PLANAR - Delayering JEOL SEM stub - optical |
| 6172.F | Sample holder for FEI SEM stubs - QR - optical - includes 1 stub |
| 6175.F | PLANAR - Delayering FEI SEM stub - optical |
| 6172.Z | Sample holder for Zeiss (Ultra 55) SEM stubs - QR - optical - includes 1 stub -- also fitsLEO |
| 6175.Z | PLANAR - Delayering Zeiss (Ultra 55)SEM stub - optical -- also fitsLEO |
