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Sample parallelism alignment with LASER precision

ULTRACOLLIMATOR modules allow the user to produce the finest results of sample parallelism with both flat lapping and selected area preparation machines. The units produce a ‘single box’ solution, incorporating an lcd screen and all the controls required to align the sample.

The use of optical alignment allows for simpler faster and significantly more accurate alignment to be achieved on a range of sample types and applications including: Crystal polishing,  Double side wafer polishing, Topside de-processing of layers of metal circuitry for  electronic failure analysis and competitive analyses, Backside polishing of packaged computer dice for ‘through silicon’ microscopy.

Further Reading

TEC Note #6: Improved de-processing of multilayer devices with optical alignment techniques

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Product Highlights

  • Works in conjunction with tilt controls to control sample alignment
  • Improves alignment accuracy up to 20X
  • Suits topside & backside electronic sample polishing
  • Suits requirements for double sided polishing


Order Codes Description


ULTRACOLLIMATOR Module to suit ASAP-1 (1st Gen)

 housing with 6 inch lcd screen, controls for beam brightness and cross-hair alignment, and reference flat; includes machine vision camera. 

-- On 2nd and subsequent generations of  ASAP-1, ULTRACOLLIMATOR is LASER-version and built in to the system. 


 ULTRACOLLIMATOR Module to suit MULTIPOL Precision Jigs.  housing with 6 inch lcd screen, controls for beam brightness and cross-hair alignment, and reference flat. Unit is free-standing also includes a mast and roller bar assembly to fit ULTRA TEC’s precision jigs

6183.UL  ULTRACOLLIMATOR Laser Module to suit ULTRAPOL Advance:  housing with 6 inch lcd screen, controls for beam brightness and cross-hair alignment, and reference flat. Unit is mounted to Advances Herad assembly for 'in situ' alignment monitoring. 


Better than 1 minute of arc

Power Requirement 

90 to 250V AC, 50/60Hz: (on Advance and MULTIPOL models

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