Jim Colvin contributes two chapters regarding Sample Preparation to the Microelectronics Failure Analysis Desk Reference (7th Edn)
ULTRA TEC is pleased to announce that Engineering Consultant, Jim Colvin – working in part with his son, Christopher – has contributed two significant chapters to the recently published 7th Edition of ASM’s “Microelectronics Failure Analysis Desk Reference”. Long established as the touchstone for electronic FA professional, the new edition looks set to carry on this tradition. The publication is …
In “Failure Analysis: Who Needs It?”, George F. Gaut Jr. provides important insight to the Failure Analysis field that most books don’t do. FA uses many engineering disciplines to accomplish the desired result of making or keeping an operation or business successful. Gaut’s book looks into the FA profession, the skill-set and analytical tools and techniques required and how FA might make sense …
“Automated Methods in Cryptographic Fault Analysis” Edited by Jakub Breier, Xiaolu Hou, and Shivam Bhasin presents a collection of methods that are useful for different aspects of fault analysis in cryptography. ULTRA TEC’s ASAP-1 IPS is utilized for chip preparation of FPGA components to enable profiling with Laser Fault Inspection. Buy the book here
Chip-Off Equipment enables Digital Forensics
ULTRA TEC offers Cold Chip-off Equipment for Digital Forensics applications. See a video intro to our THIN BLUE (Product) Line by visiting here.
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