Jim Colvin contributes two chapters regarding Sample Preparation to the Microelectronics Failure Analysis Desk Reference (7th Edn)

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ULTRA TEC is pleased to announce that Engineering Consultant, Jim Colvin – working in part with his son, Christopher – has contributed two significant chapters to the recently published 7th Edition of ASM’s “Microelectronics Failure Analysis Desk Reference”. Long established as the touchstone for electronic FA professional, the new edition looks set to carry on this tradition.

The publication is available in HARDBACK or in an ON-LINE version for EDFAS/ASM Members. Abstracts for the chapter below:

Backside Preparation and OpticsJim ColvinChristopher Colvin

Frontside Sample PreparationJim Colvin

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