Showing all 3 results
-
Height Indicators
Fast, Accurate Drop-Down Gauges- Choice of Accuracy
- Digital and Analog versions
- Granite bases available in other sizes for custom requirements
-
ULTRACOLLIMATOR
Sample Parallelism Alignment With LASER Precision- Works in conjunction with tilt controls to control sample alignment
- Improves alignment accuracy up to 20X
- Suits topside & backside electronic sample polishing
- Suits requirements for double sided polishing
-
ULTRASPEC-III
3 Wavelength Laser Illuminator- Improved imaging and contrast
- Three laser lines can be used independently or blended – 670nm, 1064nm and 1300nm
- Suits most backside microscopes
- Assists and optimizes emission microscopy, Laser, FIB, voltage, thermal, probing, and most other backside techniques