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  • Height Indicators

    Fast, Accurate Drop-Down Gauges
    • Choice of Accuracy
    • Digital and Analog versions
    • Granite bases available in other sizes for custom requirements
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  • ICis Microscope

    Materials Inspection System
    • Three Modes Available — NIR as Standard, with options for UV and high res visible
    • Custom software includes imaging, image optimization,annotation, Silicon Thickness measurement, navigation and archival functions.
    • Images topside x-section & backside electronic polished samples
    • For validation of polished surface quality and for assessing de-processing position
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    Sample Parallelism Alignment With LASER Precision
    • Works in conjunction with tilt controls to control sample alignment
    • Improves alignment accuracy up to 20X
    • Suits topside & backside electronic sample polishing
    • Suits requirements for double sided polishing
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    3 Wavelength Laser Illuminator
    • Improved imaging and contrast
    • Three laser lines can be used independently or blended – 670nm, 1064nm and 1300nm
    • Suits most backside microscopes
    • Assists and optimizes emission microscopy, Laser, FIB, voltage, thermal, probing, and most other backside techniques
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